Category: BS

BS

Posted in BS

BS PD ISO/TR 22201-3:2016

Lifts (elevators), escalators and moving walks. Programmable electronic systems in safety related applications. Life cycle guideline for programmable electronic systems related to PESSRAL and PESSRAE
standard by BSI Group, 01/31/2017

Posted in BS

BS QC 301700:1992

Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification for fixed polycarbonate film dielectric metal foil d.c. capacitors
standard by BSI Group, 01/31/1992

Posted in BS

BS PD ISO/TS 11819-3:2017

Acoustics. Measurement of the influence of road surfaces on traffic noise. Reference tyres
standard by BSI Group, 04/28/2017

Posted in BS

BS PD ISO/TR 20694:2018

A typology of language registers
standard by BSI Group, 04/13/2018

Posted in BS

BS PD ISO/TS 22077-2:2015

Health informatics. Medical waveform format. Electrocardiography
standard by BSI Group, 08/31/2015

Posted in BS

BS PD ISO/TS 13399-304:2016

Cutting tool data representation and exchange. Creation and exchange of 3D models . Solid milling cutters with arbor hole
standard by BSI Group, 02/29/2016

Posted in BS

BS PD ISO/TR 24532:2006

Intelligent transport systems. System architecture, taxonomy and terminology. Using CORBA (control object request broker architecture) in ITS standards, data registries and data dictionaries
standard by BSI Group, 07/31/2006

Posted in BS

BS S 150:1975

Specification for chromium-molybdenum-vanadium-niobium heat-resisting steel billets, bars, forgings and parts (930-1080 MPa) (Cr 10.5, Mo 0.6, V 0.2, Nb 0.3)
standard by BSI Group, 09/30/1975

Posted in BS

BS PD ISO/TS 19979:2014

Ophthalmic optics. Contact lenses. Hygienic management of multipatient use trial contact lenses
standard by BSI Group, 02/28/2015

Posted in BS

BS PD ISO/TR 945-2:2011

Microstructure of cast irons. Graphite classification by image analysis
standard by BSI Group, 04/30/2011

Posted in BS

BS PD ISO/TR 22335:2007

Surface chemical analysis. Depth profiling. Measurement of sputtering rate. Mesh-replica method using a mechanical stylus profilometer
standard by BSI Group, 08/31/2007

Posted in BS

BS QC 760100:1997

Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
standard by BSI Group, 08/15/1997