Category: IEC

Ferrite cores – Guidelines on the limits of surface irregularities – Part 8: PQ-cores
standard by International Electrotechnical Commission, 08/05/2015

Fixed capacitors for use in electronic equipment – Part 18-2: Blank detail specification – Fixed aluminium electrolytic surface mount capacitors with non-solid electrolyte – Assessment level EZ
standard by International Electrotechnical Commission, 03/12/2007

Optical fibres – Part 1-45: Measurement methods and test procedures – Mode field diameter
standard by International Electrotechnical Commission, 07/31/2001

Cable networks for television signals, sound signals and interactive services – Part 10: System performance of return paths
standard by International Electrotechnical Commission, 06/27/2005

Dimensions of low-voltage switchgear and controlgear. Standardized mounting on rails for mechanical support of electrical devices in switchgear and controlgear installations
standard by International Electrotechnical Commission, 01/01/1981

Luminaires – Part 1: General requirements and tests
standard by International Electrotechnical Commission, 05/26/2014

Expression of performance of electrochemical analyzers – Part 4: Dissolved oxygen in water measured by membrane-covered amperometric sensors
standard by International Electrotechnical Commission, 12/13/2018

Connectors for frequencies below 3 MHz for use with printed boards – Part 4: Two-part connectors for printed boards having contacts spaced at 1,91 mm (0,075 in) centres and staggered terminations at that same spacing
standard by International Electrotechnical Commission, 03/15/1987

Fixed capacitors for use in electronic equipment – Part 20: Sectional specification – Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors
standard by International Electrotechnical Commission, 01/22/2008

Semiconductor devices – Integrated circuits – Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits – Section 1: Requirements for internal visual examination
standard by International Electrotechnical Commission, 03/01/1994

Semiconductor devices – Part 6: Discrete devices – Thyristors
standard by International Electrotechnical Commission, 04/13/2016

Automatic electrical controls – Part 2-5: Particular requirements for automatic electrical burner control systems CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 08/31/2017