Category: IEC
IEC
IEC 60534-2-5 Ed. 1.0 b:2003
Industrial-process control valves – Part 2-5: Flow capacity – Sizing equations for fluid flow through multistage control valves with interstage recovery
standard by International Electrotechnical Commission, 09/05/2003
IEC 60840 Ed. 3.0 b:2004
Power cables with extruded insulation and their accessories for rated voltages above 30 kV (Um = 36 kV) up to 150 kV (Um = 170 kV) – Test methods and requirements
standard by International Electrotechnical Commission, 04/07/2004
IEC 60826 Ed. 3.0 b:2003
Design criteria of overhead transmission lines
standard by International Electrotechnical Commission, 10/10/2003
IEC 60748-2-7 Ed. 1.0 b:1992
Semiconductor devices. Integrated circuits – Part 2: Digital integrated circuits – Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
standard by International Electrotechnical Commission, 10/23/1992
IEC 60807-2 Ed. 2.0 b:1992
Rectangular connectors for frequencies below 3 MHz – Part 2: Detail specification for a range of connectors, with assessed quality, with trapezoidal shaped metal shells and round contacts – Fixed solder contact types
standard by International Electrotechnical Commission, 11/13/1992
IEC 60444-6 Ed. 2.0 b:2013
Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
standard by International Electrotechnical Commission, 06/19/2013
IEC 60748-2-5 Ed. 1.0 b:1992
Semiconductor devices – Integrated circuits – Part 2: Digital integrated circuits – Section five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
standard by International Electrotechnical Commission, 01/31/1992
IEC 60747-14-1 Ed. 2.0 b:2010
Semiconductor devices – Part 14-1: Semiconductor sensors – Generic specification for sensors
standard by International Electrotechnical Commission, 01/21/2010
IEC 60674-2 Ed. 2.1 b:2019
Specification for plastic films for electrical purposes – Part 2: Methods of test CONSOLIDATED EDITION
standard by International Electrotechnical Commission, 01/24/2019
IEC 60747-18-1 Ed. 1.0 en:2019
Semiconductor devices – Part 18-1: Semiconductor bio sensors – Test method and data analysis for calibration of lens-free CMOS photonic array sensors
standard by International Electrotechnical Commission, 05/20/2019
IEC 60601-2-21 Ed. 1.0 b:1994
Medical electrical equipment – Part 2: Particular requirements for the safety of infant radiant warmers
standard by International Electrotechnical Commission, 02/04/1994
IEC 60603-7-7 Ed. 3.0 b:2010
Connectors for electronic equipment – Part 7-7: Detail specification for 8-way, shielded, free and fixed connectors for data transmission with frequencies up to 600 MHz
standard by International Electrotechnical Commission, 05/31/2010